Refractive Index of Cadmium Sulfide Films Determined from Transmittance Measurements
نویسندگان
چکیده
منابع مشابه
Refractive index measurements of solid parahydrogen.
Solid para-H2 is a promising gain medium for stimulated Raman scattering, due to its high number density and narrow Raman linewidth. In preparation for the design of a cw solid hydrogen Raman laser, we have made the first measurements, to our knowledge, of the index of refraction of a solid para-H2 crystal, in the wavelength range of 430-1100 nm. For a crystal stabilized at 4.4 K, this refracti...
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We report a method for real-time monitoring of vapor uptake by simultaneous detection of the refractive index, n, and thickness, d, of thin transparent films with a precision of δn=10(-4) and δd<100 nm. The setup combines total internal reflection (Abbé) refractometry with an interferometric imaging method. A fast Fourier transform and phase fitting method is applied for accurate and independen...
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Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite ...
متن کاملInvestigations on structural and electrical properties of Cadmium Zinc Sulfide thin films
Nowadays, II – IV group semiconductor thin films have attracted considerable attention from the research community because of their wide range of application in the fabrication of solar cells and other opto-electronic devices. Cadmium zinc sulfide (Zn-CdS) thin films were grown by chemical bath deposition (CBD) technique. X-ray diffraction (XRD) is used to analyze the structure and crystallite ...
متن کاملDetermination of refractive index, thickness, and the optical losses of thin films from prism-film coupling measurements.
We present a method of analysis of prism-film coupler spectroscopy based on the use of transfer matrix and genetic algorithm, which allows the simultaneous determination of refractive index, thickness, and optical losses of the measured layer.
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ژورنال
عنوان ژورنال: Scientific Inquiry and Review
سال: 2019
ISSN: 2521-2435,2521-2427
DOI: 10.32350/sir.34.02